Products

Particle Size Analyser

Whatever your particular particle size analysis and particle characterization needs may be, look to us for the technology to meet them. Our instruments use techniques that include the Coulter principle, laser diffraction, light scattering and polarized intensity differential scattering (PIDS) to provide the data you require for your specific application(s).

LS13320XR

  • Direct measurement range from 10 nm – 3,500 µm
  • Automatically highlights pass/fail results for faster quality control
  • Enhanced software that simplifies method creation for standardized measurements
  • New control standards to adequately verify instrument/module performance
  • Simplified method creation for standardized measurements
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Multisizer 4e

  • Overall sizing range 0.2 μm-1,600 μm
  • 10 μm aperture for micro-particle measurement (0.2 μm)
  • Multiple security levels for 21 CFR Part 11 Compliance
  • Complex sample analysis across wide particle size distribution range
  • Quality assurance ready (multiple SOM/SOP configurations & V-check validation package)
Download Datasheet